ASPE 2022 Precision Optical Metrology
Topical Meeting & Workshop
Postponed and more information coming soon.
This meeting brings together specialists and practitioners from industry, government, and academia in an ideal forum for the exchange of ideas. We will follow the highly successful workshop format enjoyed in past meetings, with an emphasis on discussion in a relaxed atmosphere. The scope of this meeting is to showcase optical metrology and precision engineering.
Jonathan Ellis, Clerio Vision
Peter de Groot, ZYGO
Richard Leach, U. of Nottingham
Cristina Canavesi, LighTopTech Corp.
Vivek Badami, ZYGO
Felipe Guzmán, Texas A&M
Eberhard Manske, TU Illmenau
Kate Medicus, Ruda-Cardinal
Christof Pruss, U. of Stuttgart/ITO
Joanna Schmit, 4D Technology
Rong Su, Shanghai Inst. Opt. & Mech/CAS
Because of uncertainty related to conferences and travel, ASPE is offering a relaxed refund policy this year. Anyone who has registered for the topical meeting and is unable to attend or travel should reach out to firstname.lastname@example.org. If changes to the meeting are necessitated by any local, state, or federal restrictions, ASPE will work with registered attendees to either offer a refund or credit to a future event.