39th ASPE Annual Meeting Committee

Conference Chairperson
Nicholas J. Duncan, Aerotech, Inc.

Committee Members

Luis A. Aguirre, UT-Austin

Kumar Arumugam, NIST

Vivek G. Badami, Zygo Corporation

Eric S. Buice, Lawrence Berkeley National Laboratory

Keith Carlisle, Consultant

Leon Chao, NIST

Liam G. Connolly, NIST

John Cortes Gutierrez, Lawrence Livermore National Laboratory

Michael A. Cullinan, UT-Austin

Jonathan D. Ellis, Edmund Optics

Ping Guo, Northwestern University

Felipe Guzman, University of Arizona

Byron R. Knapp, Professional Instruments Company

Ryan H. Lee, Bright Silicon Technologies

Stephen J. Ludwick, Aerotech, Inc.

Don Martin, Martin-Mason

Christopher J. Morgan, Moore Nanotechnology Systems

Brian P. O’Connor, Aerotech, Inc.

Robert M. Panas, Bright Silicon Technologies

Michel Pharand, KLA

Seno B. Rekawa, LBNL

Stuart T. Smith, UNC-Charlotte

Aarush Sood, ASML

Mark A. Stocker, Cranfield Precision, Division of Fives Landis Ltd.

John S. Taylor, UNC-Charlotte

Adam Thompson, University of Nottingham

David L. Trumper, MIT