Join ASPE

In Person Only

7A, 7B-Optical Metrology for Precision Engineers Parts 1 and 2

Peter de Groot, Zygo Corporation

Monday, October 10, 2022
8:00AM – 12:00N (PDT USA) – Part 1
1:30PM – 5:30PM (PDT USA) – Part 2


Description
This is a fast-paced, comprehensive optics course for precision engineers, with an emphasis on the principles and applications of non-contact instruments for dimensional metrology.

Part 1 begins with basic geometrical optics of lenses and mirrors, moving up to common optical tools such as telescopes, autocollimators, fringe projection systems, alignment scopes, conventional and confocal microscopes, machine vision, and systems based on focus and triangulation.

Part 2 tackles dimensional metrology applications that make use of the wave nature of light, including diffraction, interference, and holography. This provides the foundation for distance-measuring interferometers and optical encoders, laser Fizeau interferometers for optical surfaces such as lenses and mirrors, and interference microscopes for surface structure analysis.

Hot topics include the latest performance enhancements, new instrument designs, vibration robustness, accommodation of highly sloped, freeform and additively manufactured surfaces, and metrology for smartphone cameras and extended reality systems.

Learning Outcomes
By the end of the course, you will have greater confidence in the selection, invention, and evaluation of optical metrology solutions for practical applications in precision engineering and manufacturing.

Intended Audience
This is a beginning to intermediate level course, with material ranging from basic to complex, to provide both an overview and reference for further study. The intended audience is engineers, scientists and measurement specialists interested in gaining a greater understanding of the operating principles and best practice use of advanced optical instrumentation.


Peter de Groot, PhD invents and develops optical metrology solutions for Zygo Corporation, a leading supplier of optical components, systems, and metrology solutions. In addition to instrument products and R&D management, his professional contributions include 200 technical papers, tutorials, and book chapters in physics, optical testing, surface structure analysis, length measurement, international metrology standards. He is an inventor for 140 US patents and is a multiple award winner for innovation. Peter is an active member of the optics and engineering communities as a contributor and educator, and is a Fellow of SPIE, Optica, the Institute of Physics, and the International Academy of Engineering Technology.