Dr. Marcin B. Bauza

From Powder to Performance – Metrology and Characterization Across the Additive Manufacturing Process Chain
Dr. Marcin B. BauzaHead of ZEISS Additive Manufacturing Process and Control, ZEISS Industrial Quality Solutions

Additive Manufacturing (AM) is being adopted by industry, primarily due to its freedom to create complex geometries and ability to create unique properties at selected part locations. However, the AM process is quite complex unlike in subtractive manufacturing where material stock is created independently and then shapes created with cutting to form desired parts, in AM the “foundry” and part shaping happens all at once, significantly increasing the complexity of the process. Therefore, it is critical, to obtain proper understanding of how the form, size and microstructure of the final components is influenced by the processing parameters. How to ensure the quality of the powder, how does the powder affects powder bed compactness and sintering process, what microstructure is created and how to heat treat the sintered part, how define part chemistry to validate proper material composition, how to identify part dimensional accuracy, surface finish inside and outside of the part, as well as correlating different characteristics to ensure much faster recipe development. This approach utilizes a multi-scale, multi-modal workflow, designed to handle the complexity of the entire AM process chain, starting from raw materials to the finished parts. The outcome would be much faster and much more cost-effective recipe development process, which today might cost millions of dollars and might take even few years to develop in some industries.


  • Powder Feedstock Characterization for AM and its Effects on Part Quality
  • Multi-scale Evaluation of Micro-Porosity, Cracks and Inclusion in AM Parts
  • Metrology Methods for Dimensional Quality Inspection
  • Using X-ray CT for NDT and Metrology applications
  • Optimizing Surface Finish Treatment Procedures for AM parts using X-ray and Confocal Microscopy
  • Microstructure Characterization to Understand Part Performance
  • Accelerated identification and mitigation of key parameters affecting quality
  • Transform Measurement Data into Meaningful Results


Biography: Dr. Marcin B. Bauza is globally leading AM group at ZEISS focusing on improvement of the AM process by significantly improving yield, reducing recipe development time, and enabling broad materials characterization with use of corelative quality control and process feedback. He is also leading technology and business development in relation to high speed and 100% inspection of surfaces and dimensional metrology, utilizing optical techniques including visible light and X ray sources. In addition, Marcin is a member of ZEISS Global Leadership Team and member of the ZEISS North America Senior Leadership Team. During his career, Marcin has been awarded with numerous patents, written more than 20 publications, and serves as reviewer for Precision Engineering, Wear, and Measurement. Marcin also served as Director and Board member of the American Society for Precision Engineering (ASPE) and has been actively involved with ASPE since 2002. He is also member of ASME and CIRP.

Marcin received his Ph.D. in Mechanical Engineering from University of North Carolina at Charlotte in 2005 with focus on design of metrology systems. Additionally, in 2012 he received EMBA from Duke University with concentration in strategy