Dr. Adam Thompson
X-ray Computed Tomography Metrology
Dr. Adam Thompson, Manufacturing Metrology Team, Faculty of Engineering, University of Nottingham, UK
In this course, we discuss the basics of measurement using X-ray computed tomography (XCT). We will cover the history of and principles behind XCT metrology, including discussion of reconstruction methods and artefacts for calibration. We will examine
specific case studies of relevance to dimensional measurement using XCT and review the state of the art in XCT measurement. We will also address some of the issues faced when making XCT measurements and the limitations of the technology, and, finally, cover the specific use of XCT for surface measurement. The aim of this course is to gain a basic understand of measurement using X-ray computed tomography, containing an overview of the theory behind how measurement data is acquired and the factors that affect measurements. The course is aimed at graduate and postgraduate engineers/physicists, post-doctoral researchers and industry technical staff working in measurement using XCT. The course is generally aimed at novice to intermediate XCT users.
Biography: Dr. Adam Thompson has been a post-doctoral researcher in the University of Nottingham (UoN) Manufacturing Metrology Team (MMT) since October 2018. Prior to this position, Adam completed his PhD in UoN’s MMT as part of the Centre for Doctoral Training in Additive Manufacture, entitled “Surface texture measurement of metal additively manufactured parts by X-ray computed tomography”, for which he was awarded the Gertrude Cropper Scholarship postgraduate prize by UoN. In his 5 years as an active researcher, Adam has published 12 papers and a book chapter, and presented his work at over 20 international conferences. Adam’s research background is in surface topography measurement of additively manufactured parts, authoring papers on the measurement of metal and polymer parts. Adam also has expertise across metrology, having undertaken postdoctoral projects in performance verification of fringe projection and X-ray computed tomography measurement. Adam also has a deep understanding of co-ordinate and in-process measurement principles, having taught numerous undergraduate and postgraduate courses in basic advanced metrology and performed research activities in the area. Prior to his PhD, Adam taught high school Physics.