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Virtual 35th Annual Meeting

Detailed Agenda

Tutorials are scheduled for October 12-19, 2020. 

View full tutorial schedule here.

All Sessions are Listed in the Following Time Zone: CDT, UTC-5, Chicago


Tuesday, October 20, 2020

TimeProgram
8:30 – 8:45 a.m. Opening Remarks
8:45 – 9:45 a.m.Keynote Address
Dr. Reiner Garreis, Carl Zeiss, Oberkochen
10:00 – 11:35 a.m.Session 1: Precision Manufacturing

10:00 a.m. Introduction

10:05 a.m. Creating Production Machinery for the 4th Industrial Revolution
Paul Shore, Loxham Precision

10:20 a.m. ILCentric – A new approach in centering optics for high-end applications
Christian Wentz and Gerrit Goetzen, Innolite GmbH

10:35 p.m. A Study of the Micro-Structure of Diamond Turned Surfaces and the Generation Diffraction Color
Takeshi Hashimoto, Ametek

10:50 a.m. Tool point receptance variation with spindle-holder-tool selection
Tony Schmitz, University of Tennessee, Knoxville

11:05 a.m. Modeling and simulation of modulated tool path (MTP) turning stability
Ryan Copenhaver, University of North Carolina-Charlotte ;Tony Schmitz, University of Tennessee, Knoxville

11:20 a.m. An Investigation of Magnetic-Field Assisted Mass Polishing for Precision Manufacturing of Optical Freeform Surfaces
Chi-Fai Cheung, The Hong Kong Polytechnic University ;CHUNJIN WANG, State Key Laboratory of Ultra-precision Machining Technology, Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, China;Kristy Loh, The Hong Kong Polytechnic University ;Lai Ting Ho, The Hong Kong Polytechnic University
11:35 a.m. – 12:00 p.m.Precision Manufacturing Live Discussion
Live Q&A session with speakers
12:00 – 1:00 p.m.Exhibit Hall/Poster Session
1:00 – 2:05 p.m.Session 2: Precision Design

1:00 p.m. Introduction

1:05 p.m. Balanced Design Effort for Contamination Control in Precision Semiconductor Measurement Equipment
Erik Hijkoop, NTS-Group;Kees Verbaan, NTS-Group ;Marcel Kouters, NTS

1:20 p.m. Design of an Ultra-precise Oscillating Blade Microtome based on Vibration Cancellation
Xinlei Fu, The Chinese University of Hong Kong;Jialong CHEN;Shih-Chi Chen, The Chinese University of Hong Kong

1:35 p.m. Optomechanical spherical manipulator with an adjustable center of rotation
Jan De Jong, University of Twente;koen Smelt, Demcon;Coen Blok, Demcon DAM BV;Dannis Brouwer, University of Twente

1:50 p.m. Efficient modeling for the design of a large-stroke fully flexure-based 6-DOF hexapod
Marijn Nijenhuis, University of Twente ;Mark Naves, University of Twente;Wouter Hakvoort, University of Twente ;Dannis Brouwer, University of Twente

2:05 – 3:00 p.m.Precision Design Live Discussion
Live Q&A session with speakers
3:00 – 4:00 p.m.Exhibit Hall & Live Networking

Wednesday, October 21, 2020

TimeProgram
7:30 – 9:05 a.m.Session 3: Controls & Mechatronics

7:30 a.m. Introduction

7:35 a.m. Decoupled, Open-Loop, Multi-DoF Rotation of an Under-Actuated, Spherical Permanent Magnetic Dipole Actuator
Tyler Hamer, Massachusetts Institute of Technology ; Joshua Chabot, MIT Lincoln Laboratory; David Trumper, Massachusetts Institute of Technology

7:50 a.m. Magnetic Levitated Linear Scan Module with Nanometer Resolution
Alexander Goos, Physik Instrumente (PI) GmbH & Co. KG; Rainer Gloess, Physik Instrumente (PI) GmbH & Co. KG

8:05 a.m. Vibration Mitigation on Precision Ball-Screw Feed-Drives Through Data-driven Tuning of Trajectory Pre-Filters
Alper Dumanli, Oregon State University ; Burak Sencer, Oregon State University

8:20 a.m. Combined servo error pre-compensation and feedrate optimization using sequential linear programming
Heejin Kim, University of Michigan, Ann Arbor; Chinedum Okwudire, University of Michigan

8:35 a.m. Oversampling Sensors for Precision Positioning Applications
Brij Bhushan, Massachusetts Institute of Technology ; David Trumper, Massachusetts Institute of Technology

8:50 a.m. Study on Improvement of Reversal Motion of NC Moving Table by Friction Force Compensation
Yusuke Inomata, Kanazawa Institute of Technology; Yoshitaka Morimoto, Kanazawa Institute of Technology; Akio Hayashi, Kanazawa Institute of Technology

9:05 – 9:30 a.m.
Controls & Mechatronics Live Discussion
Live Q&A session with speakers
9:30 – 11:00 a.m.Student Challenge
9:30 – 11:30 a.m.Exhibit Hall
11:30 a.m. – 1:30 p.m.Business Meeting & Awards Presentation
1:30 – 3:05 p.m.Session 4: Micro/Nano

1:30 p.m. Introduction

1:35 p.m. Role of precision engineering in pushing the performance limits of nanoscale additive manufacturing
Sourabh Saha, Georgia Institute of Technology

1:50 p.m. Ceramic Two-Photon Printing of High Aspect Ratio Microstructures
John Cortes, Lawrence Livermore National Laboratory

2:05 p.m. Towards 3D Part Fabrication Using a Micro-Scale Additive Manufacturing Tool
Dipankar Behera

2:20 p.m. Polarization Based Optically Variable Devices Fabricated by Elliptical Vibration Texturing
Ping Guo, Northwestern University

2:35 p.m. Design, Fabrication, and Signal Propagation Characteristics of Micro-Mechanical Logic Elements
Frederick Sun, Lawrence Livermore National Laboratory

2:50 p.m. Multi-Focus Random-Access Pump-Probe Microscopy Based on Compressive Sensing
Bingxu Chen, The Chinese University of
Hong Kong

3:05 – 3:30 p.m.Micro/Nano Live Discussion
Live Q&A session with speakers
3:30 – 4:00 p.m.Exhibit Hall & Live Networking

Thursday, October 22, 2020

TimeProgram
8:00 – 10:00 a.m.Exhibit Hall & Poster Sessions
10:00 – 11:40 a.m.Session 5: Metrology Systems

10:00 a.m. Introduction

10:05 a.m. High-precision Metrology with High-resolution Computed Tomography (or 3D X-ray Microscopes)
Herminso Villarraga-Gómez, Carl Zeiss Industrial Metrology, LLC

10:35 a.m. Nanopositioning and nanomeasuring machines for cross-scale measurement with sub-nanometer precision and nanofabrication
Eberhard Manske, Technische Universität Ilmenau

10:50 a.m. Moonshot Metrology
Melvin Liebers, Professional Instruments Company

11:05 a.m. Phase-shifting 3D imaging of rotating milling/drilling tools
Xiangyu Guo, Texas A&M University

11:25 a.m. Spindle metrology for a high resolution x-ray microscope
Byron Knapp, Professional Instruments Company

11:40 a.m. – 12:00 p.m.Metrology Live Discussion
Live Q&A session with speakers
12:00 -1:00 p.m.Exhibit Hall & Poster Session
1:00 – 2:35 p.m.Session 6: Measurement Errors & Uncertainty

1:00 p.m. Introduction

1:05 p.m. Comparison of Optical and Contact Surface Topography Measurement, Including Uncertainty
Adam Thompson, University of Nottingham

1:35 p.m. Trends in geometric error of x-ray computed tomography instruments observed at different locations in the measurement volume
Prashanth Jaganmohan, University of North Carolina at Charlotte

1:50 p.m. Software based accuracy improvement of 5-axis mac hine tools by compensation of rotary axis errors
Theresa Spaan-Burke, IBS Precision Engineering

2:05 p.m. Development of a new standard for the performance evaluation of single axis linear positioning systems
Gregory Vogl, National Institute of Standards and Technology

2:20 p.m. Flatness measurement of large surfaces applying improved sequential three-point method
Shunya Yamada, Osaka Electro-Communication University

2:35 – 3:00 p.m.Measurement Errors & Uncertainty Live Discussion
Live Q&A session with speakers
3:00 – 4:00 p.m.Closing Remarks & Live Networking