Call for Papers

Topics

Dimensional accuracy and surface finish in
additive manufacturing (AM)
• State of the art: What level of precision is achievable?
• Functional specifications for form and finish
• Prediction and modeling of dimensional errors and surface topography
• Developments in fabricating lattice structures with high integrity
• Diversity in scale of features: large-scale  micro-nano
• Precision in the broader AM context: PBF, FFF, DED, WAAM, TPL, etc.

Design for manufacturing
• Design rules and tolerancing for AM
• Topology optimization in the context of AM and achieving precision
• Novel designs for flexures and kinematic couplings
• Metallurgy and fatigue issues in high-cycle precision applications

Characterizing the performance of AM machines
• In situ process monitoring, e.g. melt zone temperature, powder bed
• In-process measurement of workpiece shape and topography
• Using artifacts to assess machine performance; round-robin testing
• Holistic views of the control system, process feedback, correction
• Machine learning to conquer the complex AM parameter space

Standards
• Certifying AM equipment capabilities and material properties
• Industrial demands for ASTM & ISO standards

Integrating AM into a holistic manufacturing process
• Cost-benefit trade-offs of using AM within a complex process chain
• Engineered partnerships between AM and secondary finishing
• Kinematic tooling or pallets for repeatable part handling

Metrology
• Surface topography measurements on rough as-built surfaces
• Dimensional metrology of internal features using computed tomography
• Multi-sensor approaches, data fusion, and machine learning
• Complex form measurement, registration, and fitting of point clouds
• Measurement of 3D lattice strut dimensional accuracy and integrity
• Characterization of internal defects and voids

Tutorials on July 11th & Tours on July 15th

Short abstracts due March 21, 2022

Submit Short Abstract>>

Printable Version of CFP

Organizing Committee

Ron Aman
EWI
David J. Bate
Nikon Metrology, UK
Liam Blunt
University of Huddersfield, UK
Douglas A. Bristow
Missouri University of Science & Technology
Simone Carmignato
University of Padova, Italy
Paul Carriere
RadiaBeam Technologies
Michael A. Cullinan
University of Texas at Austin
Peter de Groot
ZYGO Corporation
Wim Dewulf
KU Leuven, Belgium
Christopher J. Evans
University of North Carolina at Charlotte
Jason C. Fox
National Institute of Standards and Technology
Han Haitjema
KU Leuven, Belgium
Ola L. A. Harrysson
North Carolina State University
Paul Hooper
Imperial College, UK
Bradley H. Jared
University of Tennessee, Knoxville
Fred van Keulen
Delft University of Technology, Netherlands
Michael M. Kirka
Oak Ridge National Laboratory
Shan Lou
University of Huddersfield, UK
Stephen J. Ludwick
Aerotech, Inc.
Dirk Oberschmidt
TU Berlin, Germany
David Bue Pedersen
Technical University of Denmark, Denmark
Antonius T. Peijnenburg
VDL Enabling Technologies Group, Netherlands
William H. Peter
Oak Ridge National Laboratory
Senajith Rekawa
Lawrence Berkeley National Laboratory
Adriaan Spierings
inspire, AG, Switzerland
Adam Thompson
University of Nottingham, UK
Ann Witvrouw
KU Leuven, Belgium
Emma Woods
Taraz Metrology, UK
Henning Zeidler
TU Freiberg, Germany
Xiayun Zhao
University of Pittsburgh