ASPE-euspen 2020 Summer Topical Meeting – Additive Manufacturing

ASPE-euspen 2020 Summer Topical Meeting – Additive Manufacturing

ASPE-euspen Summer Topical Meeting
Advancing Precision in Additive Manufacturing

Monday July 13 – Friday July 17, 2020

Oak Ridge National Laboratory
Manufacturing Demonstration Facility
Knoxville, Tennessee, USA

John S. Taylor, University of North Carolina at Charlotte
Richard Leach, University of Nottingham, UK

Organizing Committee:
David J. Bate, Nikon Metrology, UK
Marcin B. Bauza, Carl Zeiss Industrial Metrology
Douglas A. Bristow, Missouri University of Science and Technology
Adam Brooks, EWI
Simone Carmignato, University of Padua, Italy
Christopher J. Evans, University of North Carolina at Charlotte
Wim Dewulf, KU Leuven, Belgium
Pete J. Fitsos, Lawrence Livermore National Laboratory
Jason C. Fox, National Institute of Standards and Technology
Brett Griffith, Kansas City National Security Campus
Ola L. A. Harrysson, North Carolina State University
Paul Hooper, Imperial College, UK
Bradley H. Jared, Sandia National Laboratories
Fred van Keulen, Delft University of Technology, Netherlands
Michael M. Kirka, Oak Ridge National Laboratory
Shan Lou, University of Huddersfield, UK
Stephen J. Ludwick, Aerotech, Inc.
David Bue Pedersen, Technical University of Denmark, Denmark
William H. Peter, Oak Ridge National Laboratory
Antonius T. Peijnenburg, VDL Enabling Technologies Group, Netherlands
Senajith Rekawa, Lawrence Berkeley National Laboratory
Johannes Henrich Schleifenbaum, RWTH Aachen University  & Fraunhofer-Institut für Lasertechnik ILT
Tony Schmitz, University of Tennessee, Knoxville
Adam Thompson, University of Nottingham, UK
Ann Witvrouw, KU Leuven, Belgium
Xiayun Zhao, University of Pittsburgh

Call For Papers

Paper Submission Information


  • Dimensional accuracy and surface finish in additive manufacturing (AM)
    • State of the art: What level of precision is achievable?
    • Functional specifications for form and finish
    • Prediction and modeling of dimensional errors and surface topography
    • Developments in fabricating lattice structures with high integrity
    • Diversity in scale of features: large-scale to micro-nano
  • Design for manufacturing
    • Design rules and tolerancing for AM
    • Topology optimization in the context of AM and achieving precision
    • Novel designs for flexures and kinematic couplings
    • Metallurgy and fatigue issues in high-cycle precision applications
  • Characterizing the performance of AM machines
    • In situ process monitoring, e.g. melt zone temperature, powder bed
    • In-process measurement of workpiece shape and topography
    • Using artifacts to assess machine performance; round-robin testing
    • Holistic views of the control system, process feedback, correction
    • Machine learning to conquer the complex AM parameter space
  • Standards
    • Certifying AM equipment capabilities and material properties
    • Industrial demands for ASTM & ISO standards
  • Integrating AM into a holistic manufacturing process
    • Cost-benefit trade-offs of using AM within a complex process chain
    • Engineered partnerships between AM and secondary finishing
    • Kinematic tooling or pallets for repeatable part handling
  • Metrology
    • Surface topography measurements on rough as-built surfaces
    • Dimensional metrology of internal features using computed tomography
    • Multi-sensor approaches, data fusion, and machine learning
    • Complex form measurement, registration, and fitting of point clouds
    • Measurement of 3D lattice strut dimensional accuracy and integrity
    • Characterization of internal defects and voids

Tutorials on July 13th & Tours on July 17th

Short abstracts due April 3, 2020

Printable PDF enclosure here