TM5-Optical Light Scattering Particle Counting in Clean Environments
Alexandra Lake (Particle Measurement Solutions)
Tuesday, October 27, 2026 (8:00 AM – 12:00 Noon)
Focused overview of particle science, contamination control, and cleanroom monitoring technologies used in semiconductor and advanced manufacturing environments. Content will cover fundamentals of particle behavior, measurement, and transport in air and liquid systems, along with the principles of optical particle counters and light-scattering technologies used for contamination detection. In addition to airborne and liquid particle monitoring, molecular and surface contamination, nanoparticle measurement, filtration, sampling techniques, and data analysis will be covered. Attendees will also gain insight into the cleanroom certification requirements, ISO standards, and best practices for contamination monitoring and control. Attendees will be equipped to understand contamination mechanisms, interpret particle-monitoring data, evaluate monitoring technologies, and support cleanroom operations and process performance in semiconductor and other high-tech manufacturing industries.
Learning Outcomes
You will learn about the following:
- Basic principles of optical light scattering particle counter and best sample practices
- Aerosol vs Liquid particle counting
- Data analysis from OPC tools
No prerequisites required.
Lexi Lake is an Applications Engineer with Particle Measuring Systems, serving as subject matter expert for aerosol, gas, and AMC contamination control and monitoring. Prior to this, Lexi was an Aerobiology Engineer working in Aerosol Science Research and Development validating the Aerobiology Testing Lab and designing new aerosol and microbial contamination monitoring products. Before joining Particle Measuring Systems, she designed and ran research experiments related to respiratory and airborne diseases and therapies. Lexi holds her Master of Science in Microbiology and Bachelor of Science in Biology.