Organizing Committee
Chairperson
John S. Taylor, University of North Carolina at Charlotte
Organizing Committee
Luis Aguirre, University of Texas at Austin
Kumar Arumugam, National Institute of Standards and Technology
Vivek G. Badami, Zygo
Emma Betters, Oak Ridge National Laboratory
Liam Blunt, University of Huddersfield
Eric Buice, Lawrence Berkeley National Laboratory
Brandon D. Chalifoux, University of Arizona
Leon Chao, National Institute of Standards and Technology
Liam Connolly, National Institute of Standards and Technology
Michael A. Cullinan, University of Texas at Austin
Nicholas J. Duncan, Aerotech, Inc.
Jonathan D. Ellis, Ruda Optical
Jelm Franse, System Engineering Consultant
Steven Gillmer, MIT – Lincoln Laboratory
Mert Gülçür, UT Austin and University of Warwick
Ping Guo, Northwestern University
Haibo Huang, General Atomics
Hilary Johnson, Lawrence Livermore National Laboratory
Byron R. Knapp, Professional Instruments Company
Mark Kosmowski, MKS Instruments, Inc.
Stephen J. Ludwick, Aerotech, Inc.
Don Martin, Martin-Mason LLC
Jimmie Miller, University of North Carolina at Charlotte
Chris Morgan, Moore Nanotechnology Systems
Edward P. Morse, University of North Carolina at Charlotte
Brigid A. Mullany, University of North Carolina at Charlotte
Todd Noste, Lawrence Livermore National Laboratory
Brian P. O’Connor, Aerotech, Inc.
Robert M. Panas, Bright Silicon Technologies
Robert E. Parks, Optical Perspectives Group
Antonius T. Peijnenburg, VDL Enabling Technologies Group
Michel Pharand, KLA-Tencor
Senajith B. Rekawa, Lawrence Berkeley National Laboratory
Richard Rhorer, National Institute of Standards and Technology
Jeffrey W. Roblee, Ametek Precitech, Inc.
Theo Ruijl, MI-Partners
John Schaefer, Raytheon
Burak Sencer, Oregon State University
Richard Seugling, Lawrence Livermore National Laboratory
Alexander H. Slocum, Massachusetts Institute of Technology
Stuart T. Smith, University of North Carolina at Charlotte
Alexander Sohn, Sohn Precision
Mark Stocker, Cranfield Precision, Division of Fives Landis Ltd.
David Trumper, Massachusetts Institute of Technology
Hans Vermeulen, Eindhoven University of Technology
Gregory Vogl, National Institute of Standards and Technology
Justin West, Oak Ridge National Laboratory