Monday – Friday
October 28 – November 1, 2019
Wyndham Grand Downtown Pittsburgh
Pittsburgh, Pennsylvania, USA
Conference Chair
Stephen J. Ludwick, Aerotech, Inc.
Photo Credit: David Reid/VisitPittsburgh
Conference Chair
Dr. Stephen J. Ludwick, Aerotech, Inc.
Past Chair / Advisor
Dr. Kate M. Medicus, Ruda Cardinal, Inc.
Conference Chair Elect
Dr. Marcin Bauza, Carl Zeiss Industrial Metrology, LLC
Technical Program Chairs
Prof. Jonathan D. Ellis, University of Arizona
Dr. Stephen J. Furst, Smart Material Solutions
Dr. Brandon M. Lane, National Institute of Standards and Technology
Prof. Chinedum E. Okwudire, University of Michigan
Dr. Robert M. Panas, Lawrence Livermore National Laboratory
Dr. Richard M. Seugling, Lawrence Livermore National Laboratory
Tutorials and Business Forum Chairs
Prof. Don A. Lucca, Oklahoma State University
Dr. Vivek G. Badami, Zygo Corporation, Inc.
Mr. Dan E. Luttrell, Kriterion, LLC
Exhibits and Commercial Session Chairs
Dr. Byron R. Knapp, Professional Instruments Company
Mr. Brian P. O’Connor, Aerotech, Inc.
Students and Young Members Chairs
Mr. Luis A. Aguirre, 3M Company
Prof. Stuart T. Smith, University of North Carolina – Charlotte
Local Arrangements Chairs
Prof. Mark Bedillion, Carnegie Mellon University
Prof. Xiayun (Sharon) Zhao, University of Pittsburgh
Scientific Review Committee
Luis Aguirre, 3M Company
Vivek Badami, Zyco Corporation
Martin Bamberger, DW Fritz
Chris Barns, DE Fritz
Mark Bedillion, Carnegie Mellon University
Eric Belski, Aerotech, Inc.
Charan Bodlapati, Micro-LAM, Inc.
Dannis Brouwer, University of Twente
Christopher Brown, Worcester Polytechnic Institute
Eric Buice, Lawrence Berkeley NL
Benjamin Bulla, Son-X GmbH
Nelson Cardenas, Oculus
Qunyi Chen, 3M Company
Shih-Chi Chen, The Chinese University of Hong Kong
Benny Cheung, The Hong Kong Polytechnic University
Liam Connolly, The University of Texas at Austin
Nicholas Duncan, Aerotech, Inc.
Kevin Elliot, Corning
Kaan Erkorkmaz, University of Waterloo
Christopher Evans, University of North Carolina-Charlotte
Ronnie Fesperman, US Conec Ltd.
Pete Fitsos, Lawrence Livermore National Laboratory
Jason Fox, NIST
Stephen Furst, Smart Material Solutions, Inc.
Tony Gatica, M3 Design
Tyler Hamer, MIT
Jonathan Hopkins, UCLA
Byron Knapp, Professional Instruments Company
Mark Kosmowski, Electro Scientific Ind (ESI)
Brandon Lane, National Institute of Standards & Technology
Richard Leach, University of Nottingham
Jihyun Lee, Korea Institute of Machinery & Materials(KIMM)
Dan Luttrell, Kriterion
Reg Maas, Coorstek
Eric Marsh, Penn State University
Glenn Miller, Cranfield Precision
Hossein Mohammadi, Micro-LAM, Inc.
Chris Morgan, Moore Nanotech Systems
Marijn Nijenhuis, Univ. of Twente
Brian O’Connor, Aerotech
Chinedum Okwudire, University of Michigan
Robert Panas, Lawrence Livermore National Laboratory
Ton Peijnenburg, VDL Enabling Technologies Group
Suresh Kumar Ramasamy, Apple Inc.
Jeff Roblee, AMETEK Precitech
Theo Ruijl, MI-Partners
Joerg Schmuetz, Beuth Hochschulle Fur Technik Berlin
Lars Schoeneman, Leibniz Institute for Materials Engineering
Burak Sencer, Oregon State University
Richard Seugling, Lawrence Livermore National Laboratory
Hossein Shahinian, Micro-LAM, Inc.
Hongliang Shi, Stanford University
Deming Shu, Argonne National Laboratory
Stuart Smith, UNCC
Mark Stocker, Cranfield Precision
John Taylor, LLNL/UNCC
David Trumper, MIT
Jan van Eijk, MICE bv
Deokkyun Yoon, University of Michigan
Rayne Zheng, Virginia Polytechnic Institute