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35th Annual Meeting Student Challenge

35th Annual Meeting Student Challenge

35th Annual Meeting

Monday – Friday, October 19 – 23, 2020

Renaissance Minneapolis Hotel, the Depot
Minneapolis, Minnesota, USA

Conference Chair
Marcin Bauza, Zeiss Industrial Metrology 


Ruling Engine Challenge (preliminary) 

The ASPE Student Challenge is an annual precision engineering student competition inviting students from engineering and technical disciplines to participate in designing & building a precision mechanical system and showcase their precision engineering efforts/skills during the competition at the conference. The challenge typically tests the student teams on various aspects of precision engineering including precision machine element design, mechatronics, controls, metrology and optics.  The challenge provides the students with a detailed study in the design & development of a precision system. The goal of the 2020 Student challenge is to build a mechanical ruling system & to generate a grating pattern with 50 lines per millimeter over a minimum 5 mm x 3 mm substrate area (a total of 150 to 250 lines).

Students will receive the following [2]:

  1. A scribing tool with proper angles to plow the material
  2. A 12.5 mm square silicon wafer specimen with a thick copper coating on one side
  3. One capacitance-based displacement sensor (2 mm travel) and knife edge optical sensor with a nominal beam diameter of 0.2 mm   
  4. Performance of all sensors and electronics will be supplied in a comprehensive hardware spreadsheet
  5. XY stage along with control software for operation using NI myRIO, area scanning algorithms, and a user interface
  6. Linear amplifier to control currents of up to 1 A to up to three voice coil actuators and read up to four channels of ADC with 16 bit resolution with  user manual
  7. A National Instruments myRIO for sensor data acquisition & controlling the voice-coil actuators and XY stage
  8.  ½  Mechblock kit for construction of scribing axis apparatus  plus additional blocks as per competition rules (step files will be provided)
  9. To simplify the mechatronics, the organizing committee will provide recommended subsystem controls and software for the following:
    1. Velocity and position for X and Y axes scan control
    2. Generic software interface using LabVIEW for the myRIO

Grading[1] for the challenge will be based on the following

  1. Design novelty of the instrument (100 pts)   Note: Fewer mechanical elements and a small footprint are desired.
  2. Comprehensive uncertainty budget (200 pts)
  3. Preliminary design report (200 pts)
  4. Performance at the competition (500 pts) 
    1. Quality of the grating lines:  surface roughness
    2. Grating pitch uniformity
    3. Grating straightness/linearity 
    4. Statistical measures from Zeiss Metrology are TBD
  5. The teams have 20 minutes to scribe a minimum of 150 lines. Penalties and bonuses are awarded as follows:
    1. Deduct 10 points per minute for times longer than 20 minutes
    2. Add 10 points per minute for times shorter 20 minutes
    3. Add 1 point for every line over 250 

Thank you, we look forward to another successful meeting.

ASPE Student Challenge Organizing Committee 

Luis A. Aguirre, 3M Company
Marcin Bauza, ZEISS Industrial Quality Solutions
Raymond C. Cady, Corning
Tim Dalrymple, Independent
Mark Kosmowski, ESI
Byron Knapp, Professional Instruments Company
Rober Panas, LLNL
Nilabh Roy, Canon Nanotechnologies.
Stuart T. Smith, University of North Carolina-Charlotte
Alex Sohn, Facebook Reality Labs
Rafael Marangoni, NIST