ASPEN/ASPE 2017 Spring Topical Meeting
Manufacture and Metrology of Structured and Freeform Surfaces for Functional Applications
March 14-17, 2017
The Hong Kong Polytechnic University
Hung Hom, Hong Kong
Prof. W.B. Lee, The Hong Kong Polytechnic University
Dr. Jeffrey W. Roblee, AMETEK – Precitech Inc.
The joint ASPEN(Asian Society for Precision Engineering and Nanotechnology)/ASPE (American Society for Precision Engineering) Spring Topical Meeting on the Manufacture and Metrology of Structured and Freeform Surfaces for Functional Applications is designed to focus industry, academic and governmental interest, and expertise on the advancement of technologies essential to the manufacture of structured and freeform surfaces.
Structured and freeform surfaces with functional characteristics have been widely used in many fields of industrial applications such as advanced optics, large-scale optics, aerospace, automotive, telecommunications, biomedical, micro-fluidics, etc. The meeting aims to provide an excellent opportunity and platform for academics and industries to discuss topics on the physical, mechanical, electronic, and chemical aspects of the design, fabrication and measurement of structured and freeform surfaces and their functional characteristics.
ASPEN is managing this topical meeting, and it has set-up a website for the ASPEN/ASPE 2017 Spring Topical Meeting on Manufacture and Metrology of Structured and Freeform Surfaces for Functional Applications, and you can find all of the information you need by visiting this website.