32nd Annual Meeting

 

October 29 – November 3, 2017
The Westin Charlotte
Charlotte, North Carolina, USA

Conference Chair:
Vivek G. Badami, Zygo Corporation



Technical Organizing Committee

 

Chairperson
Vivek G. Badami, Zygo Corporation


Technical Leadership Committee Chairpersons

Dannis M. Brouwer, University of Twente
Controls and Mechatronics TLC Chair

Brandon M. Lane, National Institute of Standards & Technology
Characterization TLC Chair

Jimmie A. Miller, University of North Carolina-Charlotte
Metrology Systems TLC Chair

Robert M. Panas, Lawrence Livermore National Laboratory
Micro and Nano Technologies TLC Chair

Deepak Ravindra, Micro-LAM
Precision Manufacturing TLC Chair

Mark A. Stocker, Cranfield Precision, Division of Fives Landis Ltd.
Precision Design TLC Chair

Committee Members

Gorka Aguirre, IK4-IDEKO
Luis A. Aguirre, 3M Company
David A. Arneson, Professional Instruments Company
Andrew Bagley, Cranfield Precision, Division of Fives Landis Ltd.
Martin F. Bamberger, DWFritz Automation
Michael L. Barkman, Zygo Corporation
Marcin B. Bauza, Carl Zeiss Industrial Metrology
Alex Bean, Corning Tropel Corporation
Michael Binnard, Nikon Research Corporation of America
Niels Bosmans, KU Leuven
Christopher A. Brown, Worcester Polytechnic Institute
Eric S.  Buice, Lawrence Berkeley National Laboratory
Andrew Cao, Lawrence Livermore National Laboratory
Nelson Cardenas, Oculus
Shih-Chi Chen, The Chinese University of Hong Kong
Chi-Fai Cheung, The Hong Kong Polytechnic University
Andre A. Claudet, Sandia National Laboratories
Michael A. Cullinan, The University of Texas at Austin
Timothy M. Dalrymple, Magic Leap, Inc.
Andrew J. Devitt, New Way Air Bearings
John W. Dorsey-Palmateer, Boeing Research and Technology, Retired
Thomas A. Dow, North Carolina State University
Andrew Duenner, Magic Leap, Inc.
Martin R. Dury, National Physical Laboratory
Kevin E. Elliott, Corning, Inc.
Jonathan D. Ellis, University of Rochester
Kaan Erkorkmaz, University of Waterloo
Christopher J. Evans, University of North Carolina-Charlotte
Massimiliano Ferrucci, National Physical Laboratory
Pete J. Fitsos, Lawrence Livermore National Laboratory
Craig R. Forest, Georgia Institute of Technology
Sean Garner, Corning Incorporated
Anthony W.  Gatica, M3 Design, Inc.
Steven R. Gillmer, MIT Lincoln Laboratory
Axel Grabowski, Physik Instrumente (PI) GmbH & Co. KG
Robert D. Grejda, Corning Tropel Corporation
Thomas Haase, Physik Instrumente (PI) GmbH & Co. KG
Gregory L. Holst, Georgia Institute of Technology
Jonathan B. Hopkins, University of California – Los Angeles
Bradley H. Jared, Sandia National Laboratories
Michael R. Johnson, Magic Leap, Inc.
Sajad Kafashi, University of North Carolina-Charlotte
Byron R. Knapp, Professional Instruments Company
Mark T. Kosmowski, Electro Scientific Industries, Inc.
William S. Land II, Aerotech, Inc.
Richard K. Leach, University of Nottingham
ChaBum Lee, Tennessee Technological University
Don A. Lucca, Oklahoma State University
Stephen J. Ludwick, Aerotech, Inc.
Dan E. Luttrell, Kriterion, LLC
Eric R. Marsh, The Pennsylvania State University
Fabrice Matichard, LIGO Caltech/MIT
Kate M. Medicus, Optimax Systems, Inc.
Glenn J. Miller, Cranfield Precision, Division of Fives Landis Ltd.
Hossein Mohammadi, Western Michigan University
Joshua D. Montaño, Los Alamos National Laboratory
Darcy Montgomery, Cedarflat Precision Inc.
Bala Muralikrishnan, National Institute of Standards & Technology
Bartosz Nowakowski, Hysitron, Inc.
Brian P. O’Connor, Aerotech, Inc.
Chinedum E. Okwudire, University of Michigan
Joseph D. Owen, University of North Carolina-Charlotte
Ozkan Ozturk, Canon Nanotechnologies, Inc.
Paul R. Parise, Convergent Technologies
Steven R. Patterson, University of North Carolina-Charlotte
Antonius T. Peijnenburg, VDL Enabling Technologies Group
Michael G. Pierse, Cranfield Precision, Division of Fives Landis Ltd.
Jon R. Pratt, National Institute of Standards & Technology
Suresh Kumar Ramasamy, Apple Inc.
Sourabh K. Saha, Lawrence Livermore National Laboratory
Richard M. Seugling, Lawrence Livermore National Laboratory
Hongliang Shi, Goldey-Beacom College
Deming Shu, Argonne National Laboratory
Alexander H. Slocum, Massachusetts Institute of Technology
Stuart T. Smith, University of North Carolina-Charlotte
Robert A. Smythe, Äpre Instruments, LLC
Rongrong Sun, Washington State University
John S. Taylor, Lawrence Livermore National Laboratory
Joshua Tarbutton, University of North Carolina – Charlotte
Hy D. Tran, Sandia National Laboratories
David L. Trumper, Massachusetts Institute of Technology
Mario O. Valdez, Los Alamos National Laboratory
Lucas M. Valdez, Los Alamos National Laboratory
Jan van Eijk, MICE bv
Herminso Villarraga-Gómez, Nikon Metrology, Inc.
Xiangzhi Yu, University of Rochester
Rayne Zheng, Virginia Polytechnic Institute
John C. Ziegert, University of North Carolina-Charlotte

 

 

 

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