Sunday-Tuesday, April 11-13, 2010
Massachusetts Institute of Technology
Cambridge, Massachusetts USA

The 3rd Meeting on the Control of Precision Systems will focus on new developments and fundamental techniques in feedback control as applied to precision motion control systems.  The control of precision systems encompasses a wide range of applications in high-speed, high-accuracy manufacturing and automation. The growth of nanotechnology and nanoscale manufacturing has further raised the positioning requirements for machine designers. The performance of such systems, instruments, devices, and processes depends intimately upon the innovative application of feedback principles due to the large dynamic range of controlled variables and the sensitivity to effects which might be ignorable in conventional systems.

This conference is intended to promote a broader understanding of the principles and techniques applicable for precision control, to highlight the challenges and achievements unique to our field, to bring together specialists and practitioners from industry, government, and academia for the exchange of ideas, and to identify topics for further research. The conference schedule will include a full-day tutorial, technical presentations by industry and academic experts, laboratory tours, and unstructured time to allow for networking and social interactions.

For additional information please contact:

Erika Layne
ASPE Headquarters
301 Glenwood Ave., Suite 205, Raleigh, NC 27603
(919) 839-8444
erika_layne@aspe.net
www.aspe.net/meetings/2010_Spring/2010_Spring.html

PRECISION INTERFEROMETRIC METROLOGY

JUNE 23 TO 25, 2010 – The Crowne Plaza Resort, Asheville, North Carolina

Meeting Co-Chairs:
Chris Evans and Peter De Groot of Zygo Corporation
Angela Davies of The University of North Carolina at Charlotte

We invite you to submit a short abstract for this year’s ASPE Summer Topical Meeting on PRECISION INTERFEROMETRIC METROLOGY.

Applications such a flat panel displays, IC manufacturing, automotive systems and basic science are driving demand for lower uncertainty measurements in ever more challenging environments.  This meeting will cover new developments in interferometric metrology — including new concepts and analyses, instrument development, and application examples.  In addition to paper sessions, there will be open discussion sessions and opportunities to make brief informal presentations on a variety of topics of interest.  The talks will cover a broad range of technologies and highlight potential areas for future development.

The objective of this meeting is to bring together specialists and practitioners from industry, government, and academia to provide a forum for the exchange of ideas.  The meeting will emphasize discussions as much as the presentations and the participants are encouraged to identify areas needing further research.
Contributed papers are invited, but not limited to, the following relevant topics:

·  Tools for form, figure and waviness
·  Free form optics and aspheres
·  Roughness and texture analysis
·  Stage motion control
·  Big science projects: telescope mirrors, space based applications, gravity wave detection
·  Interference microscopy
·  Micro-structure metrology
·  Dynamic measurements
·  High precision in adverse environments
·  Thin films, pattered surfaces and dissimilar materials
·  Lateral resolution beyond conventional limits
·  Semiconductor wafer metrology
·  Heroic interferometry at the limits of “what can be done”
·  Unconventional sources and wavelengths, including UV, DUV, infrared and Terahertz
·  Lost arts:  historical techniques enjoying a new life

Speakers are not required to submit full papers (although they are encouraged to do so).  However, they must produce a 1 to 6 page extended abstract for the conference Proceedings.

Abstract submissions should be made via the Internet by clicking on the “Submit Abstracts” link at the ASPE Summer Topical Meeting web site.

Submission Deadlines and Important Dates:

April 8, 2010 – Final deadline for submission of 400 – 500 word abstract to ASPE Headquarters.

April 29, 2010 – Notification of results of the Technical Committee to all authors submitting abstracts.

May 31, 2010 – Extended 1-6 page abstracts due to be included in the conference Proceedings.

The 4th ASPE Topical Meeting on Precision Interferometric Metrology will follow the format of its successful predecessors — most recently in Middlefield, Connecticut, in 2005 — with meetings in the morning, an evening Open Forum, and an afternoon free to discuss technical details, play sports, walk, shop, or just relax.

Registration will be limited to 75 participants.

Pre-Conference Visit:
Tuesday, June 22, 2010

We are planning a visit to the Center for Precision Metrology and the Department of Physics and Optical Science at University of North Carolina at Charlotte.  Preregistration will be required.

You will also find additional conference information at the ASPE web site.  Or direct your email inquiries to Erika Deutsch-Layne or by telephone at (919) 839-8444.

ASPE 2010 SPRING TOPICAL MEETING
Control of Precision Systems
April 11-13, 2010
MIT Campus
Cambrdge, Massachusetts

ASPE 25TH ANNUAL MEETING
Sunday, October 31 to
Friday, November 5, 2010
Omni Hotel at CNN Center
Atlanta, Georgia

ASPE has changed the dates of its 2010 Spring Topical Meeting in Cambridge, Massachusetts.  The meeting will be held from Sunday, April 11, 2010 thru Tuesday, April 13, 2010.  Please review the following Call for Papers, complete with the new dates.  Visit the ASPE Website for more Spring Meeting information and to submit your 400-500 word abstract.

ASPE 2010 Spring Topical Meeting
Control of Precision Systems
Sunday-Tuesday, April 11-13, 2010
Massachusetts Institute of Technolgy
Cambridge, Massachusetts, USA

Meeting Co-Chairmen:
David L. Trumper
Massachusetts Institute of Technology
Jeff Roblee
AMETEK – Precitech, Inc.
Stephen Ludwick
Aerotech, Inc.
Jan van Eijk
Delft University of Technology – Mice BV

The 3rd Meeting on the Control of Precision Systems will focus on new developments in feedback control as applied to precision systems. We also encourage presentations of a tutorial nature which elaborate principles essential to achieving high performance in precision control systems.

The control of precision systems encompasses a wide range of applications in high-speed, high-accuracy manufacturing and automation. The growth of nanotechnology and nanoscale manufacturing has further raised the positioning requirements for machine designers. The performance of such systems, instruments, devices, and processes depends intimately upon the innovative application of feedback principles due to the large dynamic range of controlled variables and the sensitivity to effects which might be ignorable in conventional systems.

This conference is intended to promote a broader understanding of the principles and techniques applicable for precision control, to highlight the challenges and achievements unique to our field, to bring together specialists and practitioners from industry, government, and academia for the exchange of ideas, and to identify topics for further research. The conference schedule will include significant unstructured time to allow for technical and social interactions.

Sunday, April 11th
Tutorial: “Fundamentals of Precision System Control”
This full-day tutorial will present an overview of the control of precision systems, from the viewpoint of practical applications of control principles.
Instructors: David L. Trumper, Stephen Ludwick, Jan van Eijk

Monday, April 12th
Technical Sessions, Lab Tours & Networking Dinner

Tuesday, April 13th
Technical Sessions

25th Annual Meeting
of the American Society for Precision Engineering
Sunday, October 31 – Friday, November 5, 2010
Omni Hotel at CNN Center
Atlanta, GA USA

Conference Chairperson:
David D. Gill
Sandia National Laboratories

The 2010 American Society for PrecisionEngineering Annual Meeting will provide a forum for presentation and discussion of the latest technical information and achievements in precision engineering. The meeting will introduce new concepts, processes, equipment, and products while highlighting recent advances in precision measurement, design, control, and fabrication. The program includes a series of oral presentations and poster paper presentations, tutorials on precision engineering topics, exhibits displaying the state-of-the-art in precision engineering products and research, a commercial session for industrial presentations, an open forum, social events, and tours of local precision engineering facilities.

Papers are being solicited in the technical areas listed. Topics related to education or historical perspectives on precision engineering are also appropriate. Papers will be considered for ora lpresentation or poster presentation.

A 400 to 500 word abstract and scholarship applications are due on March 15, 2010.

Student scholarships will be available to full-timegraduate students enrolled in an accredited university. The grants will include waiver of conference registration and tutorial fees, and a stipend to assist with travel, lodging and mea lexpenses. Application deadline is March 15, 2010.

Technical Topic Areas:

Visit the ASPE website at www.aspe.net for information on the 25th ASPE Annual Meeting.

Abstract Submission Deadline: March 15, 2010
Submit Abstracts Online>>>