Met & Props 2015


   
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15th International Conference on
Metrology and Properties of Engineering Surfaces

March 2-5, 2015
University of North Carolina at Charlotte
Charlotte, North Carolina, USA

Chair: Christopher J. Evans
University of North Carolina - Charlotte, USA


Welcome to Met & Props 2015!

The University of North Carolina at Charlotte (UNC-Charlotte) will host the 15th International Conference on Metrology and Properties of Engineering Surfaces in Charlotte, North Carolina, USA on March 2-5, 2015. UNC-Charlotte is home to the The Center for Precision Metrology, an interdisciplinary association of UNC Charlotte faculty and student researchers, allied with industrial partners in the research, development and integration of precision metrology as applied to manufacturing. The Conference will include technical talks that will inspire questions and leave opportunities for discussion, poster presentations, table top exhibits, lab tours, as well as ample opportunity for networking. Looking forward to seeing you in Charlotte.


Where is the Met & Props Conference?

The conference will be held on the Charlotte Reserach Institute (CRI) Campus, not on the UNC-Charlotte Main Campus. Everything you need to know about how to get to CRI and where to go from there is located in the Transportation section of this website.


Program Highlights
Welcome Reception
Monday, March 2, 2015, 5:45 PM
Welcoming Remarks by Robert G. Wilhelm, Vice Chancellor for Research and Economic Development and Executive Director of the Charlotte Research Institute

Keynote Speaker
Tuesday, March 3, 2015, 9:00 AM
M. B. Grant, Caterpillar Technical Center, USA
"Current Challenges in Surface Metrology: An Industrial Perspective"

Panel Discussion
Tuesday, March 3, 2015, 10:00 AM
"Open Questions in Surface Metrology"
Moderators: C. J. Evans, University of North Carolina - Charlotte, USA
R. K. Leach, University of Nottingham, UK

Read IOP article "Open Questions in Surface Topography Measurement: A Roadmap"


Invited Papers
  • Tuesday, March 3, 2015, 11:00 AM
    "Metrology for Bio-Systems"
    L. Blunt, University of Huddersfield, UK
  • Tuesday, March 3, 2015, 2:00 PM
    "Surface and Near Surface Characteristics of Additive Manufactured Components"
    J. S. Taylor, Lawrence Livermore National Laboratory, USA
  • Wednesday, March 4, 2015, 9:00 AM
    "Uncertainty in Measurements of Surface Topography"
    H. Haitjema, Mitutoyo Research Center Europe B.V., The Netherlands
  • Wednesday, March 4, 2015, 11:00 AM
    "Standards and Specifications for Areal Surface Metrology Instruments"
    P. de Groot, Zygo Corp, USA
  • Thursday, March 5, 2015, 9:00 AM
    "Perspectives on the Use of Scales in Analyzing Surface Topography"
    C. Brown, Worcester Polytechic Institute, USA and L. He, Intel Corp, USA
  • Thursday, March 5, 2015, 11:00 AM
    "Affective Surface Engineering - the Art of Creating Emotional Response from Surfaces"
    Rosen, B.-G.; Eriksson, L.; Bergman, M. (Halmstad University)
   
   
 
 
   
 

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15th International Conference on Metrology and Properties of Engineering Surfaces organized by
University of North Carolina-Charlotte
American Society for Precision Engineering
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